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What is a probe card?
A probe card is a jig used for electrical testing of an LSI (large-scale integrated circuit) chip on a wafer during the wafer test process in LSI manufacturing.
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What is semiconductor test equipment (IC tester)?
Semiconductor test equipment (IC tester), or automated test equipment (ATE), is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
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What is a wafer prober?
A wafer prober is a system used for electrical testing of wafers in the semiconductor development and manufacturing process.
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What is a package probe (test socket)?
There are two important tests in semiconductor manufacturing. One is the wafer test during the wafer process, in which electrical characteristics of chips are tested before dicing a wafer into many pieces of semiconductor (called dies or chips). The other is the final test during the assembly and testing process, which is conducted after packaging the diced chips.
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What is J-Contacts?
The J-Contacts series offers test sockets with contact terminals of the unique rigid type (integrated type) using elastomer (silicon rubber), as opposed to the leaf spring type often used for burn-in sockets. Therefore, J-Contacts features shorter contact terminals than conventional the leaf spring type and superior electrical characteristics, particularly high frequency characteristics.
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What is an FPD test?
In the flat panel display (FPD) manufacturing process, tests to check panel functions and tests to evaluate the manufacturing process are conducted.
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What is a probe unit?
A probe unit is a testing instrument to be mounted on a prober to contact the panel to transmit electrical signals for FPD testing. Probe unit types vary according to the purpose of the test, size of the panel, resolution, and other requirements.
