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μTAT 5100(33MHz、4096pin 256 DUTs)

High pin count 33MHz tester

Item

Spec.

Remarks

Pin Count

4096-IO Pin

HSDR/HSCMP:32CH

DPS-CH #/DUT

1A /4CH

@64DUT

PMU-CH#

256CH

16PE/CH

DUTs

256DUT

Test Rate

1KHz-33MHz

Pattern Memory

64MW

可擴張至128MW

Freq. test

≦60MHz

All of PE

HSCMP:≦120MHz

Language

C language

Spread Sheet

μTAT 5100-Mini(33MHz、512pin 16DUTs)

 

 

Item

Spec.

Remarks

Pin Count

512-IO Pin

HSDR/HSCMP:4CH

DPS-CH#/DUT

1A /4CH

8DUT

PMU-CH#

32CH

16PE/CH

DUTs

16DUT

Test Rate

1KHz-33MHz

Pattern Memory

64MW

可擴張至128MW

Freq. test

≦60MHz

All of PE
HSCMP:≦120MHz

Language

C language

Spread Sheet

μTAT 5300(100MHz、2048pin )

 High Speed High Pin Count Tester Direct I/F with STIL   

 

Specification

 

Item

Spec.

Remarks

Max. Pin count

2048-IO Pin

DPS-CH#/DUT

8DPS/64pin

PMU-CH#

Per Pin

Parallel Test

64DUT

Test Rate

100MHz

Pattern Memory

128MW

Program Language

Spread sheet

STIL IEEE

μTAT5300-Cube(100MHz、512pin)

  High Speed  Compact 

 

 

Specification

 

 

Item

Spec.

Remarks

Max. Pin Count

512-IO Pin

DPS-CH#/DUT

8DPS/64pin

PMU-CH#

Per Pin

Parallel test

16DUT

Test Rate

100MHz

Pattern Memory

128MW 

Program Language

Spread sheet

STIL IEEE

1.2.3.